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Proceedings Paper

Metal island films near the surface of optical coatings: deposition experiments and plasmon-absorption line adjustment of metal nanoclusters in organic and inorganic optical thin films
Author(s): Olaf Stenzel; Alexander Stendal; Michael Roeder; Andrei Lebedev; Axel Franke; Christian von Borczyskowski
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Paper Abstract

We present experiments on the optical properties of ultrathin (a few nanometers thick) films (copperphthalocyanine, amorphous silicon) with an incorporated metal cluster film (silver, indium). Due to the spatially close interface, the plasmon absorption may be displaced from its resonance frequency in the bulk, and its average position may be controlled by the average thickness of the ultrathin optical film. For example, we observe a shift of the plasmon resonance of silver clusters in amorphous silicon films (on quartz glass) from 440 nm to 740 nm, when the silicon thickness increases from `zero' up to 15 nm. The deposition experiments are accompanied by investigation of the film structure, particularly in order to estimate the silver cluster diameter, which is around 3 nm or less. Additionally, numerical simulations are in progress to optimize the island film preparation conditions.

Paper Details

Date Published: 1 October 1997
PDF: 9 pages
Proc. SPIE 3133, Optical Thin Films V: New Developments, (1 October 1997); doi: 10.1117/12.279115
Show Author Affiliations
Olaf Stenzel, Technical Univ. Chemnitz-Zwickau (Germany)
Alexander Stendal, Technical Univ. Chemnitz-Zwickau (Germany)
Michael Roeder, Technical Univ. Chemnitz-Zwickau (Germany)
Andrei Lebedev, Technical Univ. Chemnitz-Zwickau (Germany)
Axel Franke, Technical Univ. Chemnitz-Zwickau (Germany)
Christian von Borczyskowski, Technical Univ. Chemnitz-Zwickau (Germany)


Published in SPIE Proceedings Vol. 3133:
Optical Thin Films V: New Developments
Randolph L. Hall, Editor(s)

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