Share Email Print

Proceedings Paper

Characterization of surface and bulk effects by variable-area diode test structures in HgCdTe technology: contribution of series and contact resistances
Author(s): Vishnu Gopal
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The contribution of the series resistance and contact resistance has been taken into account while working out the relation between zero bias resistance-area product and perimeter-to-area ratio of the diodes in variable area diode test structures. The effect of these resistances on the interpretation of the results from the variable area array experiment in HgCdTe test structures is discussed. The analysis of the experimental data to explain some of the past unexplained observations is presented.

Paper Details

Date Published: 23 October 1997
PDF: 6 pages
Proc. SPIE 3122, Infrared Spaceborne Remote Sensing V, (23 October 1997); doi: 10.1117/12.279004
Show Author Affiliations
Vishnu Gopal, Solid State Physics Lab. (India)

Published in SPIE Proceedings Vol. 3122:
Infrared Spaceborne Remote Sensing V
Marija Strojnik; Bjorn F. Andresen, Editor(s)

© SPIE. Terms of Use
Back to Top