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Proceedings Paper

PC detector passivation for high performance
Author(s): Robert J. Martineau; Zhiqing Shi; Kelley Hu; Sridhar Manthripragada; F. A. Peters; Andre S. Burgess; John Godfrey; Danny J. Krebs
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Paper Abstract

Probably the most important factor in producing HgCdTe detectors of high performance is surface passivation. A good passivant for PC HgCdTe detectors accumulates the surface thereby reflecting minority carriers from surface imperfections and increasing minority carrier lifetime. A variety of passivants are known and used to various degrees, including sulfides, fluorides, oxides, and others. One of the problems with known passivants is that they tend to accumulate the surface too strongly, thus producing non-optimal results. We have developed a new passivation process which passivates the surface without strong accumulation. This results in detector resistance that is about 50%higher than that achieved with traditional KOH passivation, responsivities that are from 100 to 200% higher, and detectivities that are from 50to 100% higher for long wavelength devices. Materials and processing details used to achieve these results, as well as experimental data will be presented. Keyword: passivation, infrared, HgCdTe, detector

Paper Details

Date Published: 23 October 1997
PDF: 7 pages
Proc. SPIE 3122, Infrared Spaceborne Remote Sensing V, (23 October 1997); doi: 10.1117/12.279000
Show Author Affiliations
Robert J. Martineau, NASA Goddard Space Flight Ctr. (United States)
Zhiqing Shi, Hughes STX Corp. (United States)
Kelley Hu, Hughes STX Corp. (United States)
Sridhar Manthripragada, NASA Goddard Space Flight Ctr. (United States)
F. A. Peters, NASA Goddard Space Flight Ctr. (United States)
Andre S. Burgess, NASA Goddard Space Flight Ctr. (United States)
John Godfrey, NASA Goddard Space Flight Ctr. (United States)
Danny J. Krebs, NASA Goddard Space Flight Ctr. (United States)

Published in SPIE Proceedings Vol. 3122:
Infrared Spaceborne Remote Sensing V
Marija Strojnik; Bjorn F. Andresen, Editor(s)

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