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Proceedings Paper

Mueller matrix imaging of GaAs/AlGaAs self-imaging beamsplitting waveguides
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Paper Abstract

Imaging polarimetry is a novel method of characterizing the polarization effects of optoelectronic devices. From the Mueller matrix image, any polarization property of a device can be determined. High resolution polarization images of the outcoupling faces of several self-imaging GaAs/AlGaAs waveguide beamsplitters were made in the Mueller matrix imaging polarimeter at the University of Alabama in Huntsville. Interesting polarization states of the device modes (TE and TM), the magnitude of linear retardance varied significantly across a device. Polarization losses were also observed to vary across the faces of the devices. These effects could not have been observed by simply measuring the crosstalk between the TE and TM modes. The results of this study could lead to the detection of defect mechanisms in optoelectronic devices through Mueller matrix measurements.

Paper Details

Date Published: 3 October 1997
PDF: 8 pages
Proc. SPIE 3121, Polarization: Measurement, Analysis, and Remote Sensing, (3 October 1997); doi: 10.1117/12.278982
Show Author Affiliations
Matthew H. Smith, Univ. of Alabama in Huntsville (United States)
Elizabeth A. Sornsin, Univ. of Alabama in Huntsville (United States)
Tristan Jorge Tayag, Army Research Lab. (United States)
Russell A. Chipman, Univ. of Alabama in Huntsville (United States)


Published in SPIE Proceedings Vol. 3121:
Polarization: Measurement, Analysis, and Remote Sensing
Dennis H. Goldstein; Russell A. Chipman, Editor(s)

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