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Proceedings Paper

Four-port Fabry-Perot/Michelson interferometer: polarization-dependent response and ellipsometry
Author(s): Rasheed M. A. Azzam; M. Nazim Uddin
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Paper Abstract

The com;lex amplitude reflection and transmission coefficients for the p and s polarizations at oblique incidence are determined for a four-port solid-substrate Fabry-Perot/Michelson interferometer. The amplitude response for each of the two reflected and two transmitted waves is considered as a function of the angle of incidence and optical path length. Incidence angles for maximum back reflection and maximum back transmission are noted for both polarizations. The presence of multiple ports enables four ellipsometric functions to be measured simultaneously, which is desirable for the accurate and unambiguous characterization of deposited thin films. Results are presented for reflection and transmission ellipsometry of a growing transparent MgF2 film on the planar entrance face of a ZnS-prism interferometer.

Paper Details

Date Published: 3 October 1997
PDF: 20 pages
Proc. SPIE 3121, Polarization: Measurement, Analysis, and Remote Sensing, (3 October 1997); doi: 10.1117/12.278980
Show Author Affiliations
Rasheed M. A. Azzam, Univ. of New Orleans (United States)
M. Nazim Uddin, Univ. of New Orleans (United States)


Published in SPIE Proceedings Vol. 3121:
Polarization: Measurement, Analysis, and Remote Sensing
Dennis H. Goldstein; Russell A. Chipman, Editor(s)

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