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Proceedings Paper

Measurement of low-level strain retardation in optical materials
Author(s): Theodore C. Oakberg
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Paper Abstract

A method for measurement of low-level strain birefringence in optical elements and materials will be described. This method provides for the simultaneous measurement of magnitude and direction of the net retardation without the necessity of sample rotation. Good agreement was obtained between measured retardation and independent measurements of a polymer waveplate. Measurements were also made of uncalibrated samples with retardation magnitudes down to 1.5 nanometers.

Paper Details

Date Published: 3 October 1997
PDF: 5 pages
Proc. SPIE 3121, Polarization: Measurement, Analysis, and Remote Sensing, (3 October 1997); doi: 10.1117/12.278974
Show Author Affiliations
Theodore C. Oakberg, Hinds Instruments, Inc. (United States)


Published in SPIE Proceedings Vol. 3121:
Polarization: Measurement, Analysis, and Remote Sensing
Dennis H. Goldstein; Russell A. Chipman, Editor(s)

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