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Proceedings Paper

Measurement of waveplate retardation using a photoelastic modulator
Author(s): Theodore C. Oakberg
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Paper Abstract

A system for measurement of waveplate retardation using a photoelastic modulator will be described. The system is intended for incoming quality inspection of quarter-wave plates at 632.8 nm and 900 nm. Measurement of several polymer waveplates were in good agreement with the waveplate manufacturer's calibration data.

Paper Details

Date Published: 3 October 1997
PDF: 4 pages
Proc. SPIE 3121, Polarization: Measurement, Analysis, and Remote Sensing, (3 October 1997); doi: 10.1117/12.278971
Show Author Affiliations
Theodore C. Oakberg, Hinds Instruments, Inc. (United States)


Published in SPIE Proceedings Vol. 3121:
Polarization: Measurement, Analysis, and Remote Sensing
Dennis H. Goldstein; Russell A. Chipman, Editor(s)

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