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Proceedings Paper

Co- and cross-polarized fields scattered from irregular layered structures: full wave analysis
Author(s): Ezekiel Bahar; Yuzhi Zhang
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Paper Abstract

The full wave solution for scattering from 2D irregular layered structures is expressed a sum of the radiation fields, the lateral waves, and the surface waves. Only the radiation far fields are considered in this work, since excitations of plane waves are considered and the observation points are in the far field region. The like and cross polarized diffuse scattered fields are derived for three medium irregular structures with 2D rough interfaces. The thickness of the coating material or thin film between the two interfaces is assumed to be constant. Thus in this case both interfaces are rough and there are five different scattering processes identified in the full wave results. The full wave diffuse scatter solutions reduce to the perturbation solution when the surface rms heights and slopes are very small and of the same order of smallness. When the surface radii of curvature and rms heights ar very large the full wave scatter solutions reduce to the physical optics solutions. The polarimetric solutions can be applied to remote sensing of dielectric coating materials on rough surfaces.

Paper Details

Date Published: 3 October 1997
PDF: 10 pages
Proc. SPIE 3121, Polarization: Measurement, Analysis, and Remote Sensing, (3 October 1997); doi: 10.1117/12.278965
Show Author Affiliations
Ezekiel Bahar, Univ. of Nebraska/Lincoln (United States)
Yuzhi Zhang, Univ. of Nebraska/Lincoln (United States)


Published in SPIE Proceedings Vol. 3121:
Polarization: Measurement, Analysis, and Remote Sensing
Dennis H. Goldstein; Russell A. Chipman, Editor(s)

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