Share Email Print
cover

Proceedings Paper

Modular optoelectronic scanner MOS in orbit: results of the in-flight calibration
Author(s): Karl-Heinz Suemnich; Horst H. Schwarzer
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The MOS instruments on the Indian satellite IRS-P3 are now working for one year in orbit. Beside the calibration of the instrument during laboratory experiments the methods and tools of the in-orbit calibration gives a reliable basis for the interpretation of the remotely sounded data from the earth atmosphere-surface system. As a part of the in-orbit quality assurance the relative internal calibration together with the absolute recalibration with the extraterrestrial sun irradiance provides data for checking the instrument parameters. The principles of the system and the results of the one year operations are discussed.

Paper Details

Date Published: 31 October 1997
PDF: 7 pages
Proc. SPIE 3118, Imaging Spectrometry III, (31 October 1997); doi: 10.1117/12.278932
Show Author Affiliations
Karl-Heinz Suemnich, German Aerospace Research Establishment (Germany)
Horst H. Schwarzer, German Aerospace Research Establishment (Germany)


Published in SPIE Proceedings Vol. 3118:
Imaging Spectrometry III
Michael R. Descour; Sylvia S. Shen, Editor(s)

© SPIE. Terms of Use
Back to Top