Share Email Print

Proceedings Paper

Correlation between crystal morphology and x-ray performance of a CdZnTe detector
Author(s): Marcos Bavdaz; Anthony J. Peacock; Seppo Arvo Anter Nenonen; M. A. Jantunen; Mari-Anne A. Gagliardi; Turkka O. Tuomi; K. T. Hjelt; M. Juvonen; R. Rantamaki; Stefan Kraft; Marco Wedowski; Frank Scholze; Gerhard Ulm; Patrick J. McNally; J. Curley; A. N. Danilewsky
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Using a CdZnTe sample detector, a variety of diagnostic tools are applied, so as to assess the crystal characteristics and to compare these to the x-ray response measured with synchrotron radiation. Correlations are found, such that x-ray response degrading processes can be identified. In this respect the performance of the detector is found to be limited by both large scale defects such as some grain boundaries and also pipes and by crystal imperfections, together with impurities and other crystal defects, both at the surface and in the bulk crystal. The relatively soft CdZnTe crystals are very sensitive to improper handling, producing particularly surface damage, which in turn deteriorates the detector performance, as is rather clearly established by photoluminescence measurements.

Paper Details

Date Published: 15 October 1997
PDF: 11 pages
Proc. SPIE 3114, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII, (15 October 1997); doi: 10.1117/12.278895
Show Author Affiliations
Marcos Bavdaz, European Space Agency/ESTEC (Netherlands)
Anthony J. Peacock, European Space Agency/ESTEC (Netherlands)
Seppo Arvo Anter Nenonen, Metorex International Oy (Finland)
M. A. Jantunen, Metorex International Oy (Finland)
Mari-Anne A. Gagliardi, Metorex International Oy (Finland)
Turkka O. Tuomi, Helsinki Univ. of Technology (Finland)
K. T. Hjelt, Helsinki Univ. of Technology (Finland)
M. Juvonen, Helsinki Univ. of Technology (Finland)
R. Rantamaki, Helsinki Univ. of Technology (Finland)
Stefan Kraft, Physikalisch-Technische Bundesanstalt (Germany)
Marco Wedowski, Physikalisch-Technische Bundesanstalt (Germany)
Frank Scholze, Physikalisch-Technische Bundesanstalt (Germany)
Gerhard Ulm, Physikalisch-Technische Bundesanstalt (Germany)
Patrick J. McNally, Dublin City Univ. (Ireland)
J. Curley, Dublin City Univ. (Ireland)
A. N. Danilewsky, Albert-Ludwigs-Univ. (Germany)

Published in SPIE Proceedings Vol. 3114:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII
Oswald H. W. Siegmund; Mark A. Gummin, Editor(s)

© SPIE. Terms of Use
Back to Top