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Proceedings Paper

AXAF: the Science Instrument Module
Author(s): Mark A. Skinner; Steven P. Jordan
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Paper Abstract

This paper describes the mechanical configuration of the science instrument module (SIM) used on the Advanced X-ray Astrophysical Observatory (AXAF-I). The SIM houses the focal plane scientific instruments of AXAF and provides instrument selection and focusing capabilities. It is designed to meet a large number of requirements of both the science instruments and the observatory. An overview of the SIM is provided and a brief description of the components and their functions is presented.

Paper Details

Date Published: 15 October 1997
PDF: 9 pages
Proc. SPIE 3114, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII, (15 October 1997); doi: 10.1117/12.278891
Show Author Affiliations
Mark A. Skinner, Ball Aerospace & Technologies Corp. (United States)
Steven P. Jordan, Ball Aerospace & Technologies Corp. (United States)


Published in SPIE Proceedings Vol. 3114:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII
Oswald H. W. Siegmund; Mark A. Gummin, Editor(s)

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