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Proceedings Paper

Spectrometers for the solar patrol of extreme ultraviolet and soft x-ray radiation
Author(s): Sergey V. Avakyan; Alexander I. Yefremov
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Paper Abstract

The variations of the intensity and spectral distribution of the EUV and x-ray solar fluxes from the whole disk in the wavelength range 0.1 - 134 nm are the main reason of changes in all upper atmospheric and ionospheric parameters and one of the principal factors in the solar-terrestrial relation changes. However the permanent monitoring of the solar EUV and soft x-ray radiation (0.8 - 120 nm) is absent at present. In this paper the recent advances in the elaboration of the topical-electronic apparatus complex for the permanent space patrol of EUV and soft x-ray solar radiation are discussed and optical schemes of solar spectrometers of grazing and normal incidence with diffraction gratings and also their energetic characteristics are presented.

Paper Details

Date Published: 11 July 1997
PDF: 7 pages
Proc. SPIE 3113, Grazing Incidence and Multilayer X-Ray Optical Systems, (11 July 1997); doi: 10.1117/12.278871
Show Author Affiliations
Sergey V. Avakyan, S.I. Vavilov State Optical Institute (Russia)
Alexander I. Yefremov, S.I. Vavilov State Optical Institute (Russia)

Published in SPIE Proceedings Vol. 3113:
Grazing Incidence and Multilayer X-Ray Optical Systems
Richard B. Hoover; Arthur B. C. Walker, Editor(s)

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