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Proceedings Paper

Response function of the SODART-OXS Bragg spectrometer on board the SRG satellite
Author(s): Hans-Joachim Wiebicke; Ingolf Halm; Finn Erland Christensen; Niels J. Westergaard; Salim Abdali
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Paper Abstract

The SODART x-ray telescope includes an objective crystal spectrometer (OXS) providing an energy resolving power around 1000 by Bragg reflection upon crystals. A program to calculate the SODART-OXS response function is described. It includes the simulation of the arrangement of the LiF, Si, and RAP crystals on the Bragg panel, the angle-dependent projection of the infalling x rays onto the mirrors, and the partial shadowing of the panel by the entrance door. The response function depends also on the parameters of the crystals (reflectivity and rocking curve width), using calculated and measured values in their energy dependence. The effective area of the mirror shells and the detector efficiencies are included, too. The energy dependences of the individual factors are shown and used to define an optimal crystal layout taking simulated and measured x-ray source lines (within the XANADU package) to find the most important Bragg-angle regions. It turns out that the optimal Si-RAP crystal distribution on the panel is asymmetric, thus favoring high-energy Si and low-energy RAP line regions. The response functions are displayed and used for the calculation of count rates for line and continuum registration.

Paper Details

Date Published: 11 July 1997
PDF: 14 pages
Proc. SPIE 3113, Grazing Incidence and Multilayer X-Ray Optical Systems, (11 July 1997); doi: 10.1117/12.278860
Show Author Affiliations
Hans-Joachim Wiebicke, Astrophysikalisches Institut Potsdam (Germany)
Ingolf Halm, Astrophysikalisches Institut Potsdam (Germany)
Finn Erland Christensen, Danish Space Research Institute (Denmark)
Niels J. Westergaard, Danish Space Research Institute (Denmark)
Salim Abdali, Danish Space Research Institute (Netherlands)


Published in SPIE Proceedings Vol. 3113:
Grazing Incidence and Multilayer X-Ray Optical Systems
Richard B. Hoover; Arthur B. C. Walker, Editor(s)

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