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Proceedings Paper

Preliminary test results on spectral resolution of the Low Energy Transmission Grating Spectrometer on board of AXAF
Author(s): A. C. Brinkman; C. J. Th. Gunsing; Jelle S. Kaastra; Heinrich W. Braeuninger; Gisela D. Hartner; Peter Predehl; Jeremy J. Drake; Jiahong Zhang Juda; Michael Juda; Daniel Dewey; Kathryn A. Flanagan; Herman L. Marshall
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Paper Abstract

The AXAF-payload consisting of a high resolution telescope, two different transmission gratings and two imaging detection systems, has been extensively tested between mid December 1996 and the end of April 1997. In this paper we report a few preliminary results on the resolution of the low energy transmission grating spectrometer. The measurements reported here utilize different x-ray sources and different detector systems. The resolving power at long wavelength ((Delta) (lambda) at 130 angstrom) equals 0.074 angstrom.

Paper Details

Date Published: 11 July 1997
PDF: 12 pages
Proc. SPIE 3113, Grazing Incidence and Multilayer X-Ray Optical Systems, (11 July 1997); doi: 10.1117/12.278846
Show Author Affiliations
A. C. Brinkman, Space Research Organization Netherlands (Netherlands)
C. J. Th. Gunsing, Space Research Organization Netherlands (Netherlands)
Jelle S. Kaastra, Space Research Organization Netherlands (Netherlands)
Heinrich W. Braeuninger, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Gisela D. Hartner, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Peter Predehl, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Jeremy J. Drake, Smithsonian Astrophysical Observatory (United States)
Jiahong Zhang Juda, Smithsonian Astrophysical Observatory (United States)
Michael Juda, Smithsonian Astrophysical Observatory (United States)
Daniel Dewey, Massachusetts Institute of Technology (United States)
Kathryn A. Flanagan, Massachusetts Institute of Technology (United States)
Herman L. Marshall, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 3113:
Grazing Incidence and Multilayer X-Ray Optical Systems
Richard B. Hoover; Arthur B. C. Walker II, Editor(s)

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