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Proceedings Paper

Spectral fitting in AXAF calibration detectors
Author(s): Richard J. Edgar; Eugene Y. Tsiang; Allyn F. Tennant; S. A. Vitek; Douglas A. Swartz
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Paper Abstract

We discuss details of the spectral fitting procedures and algorithms used in deriving line count rates for the calibration of AXAF (the Advanced X-ray Astrophysics Facility) during end-to-end testing in the winter and spring of 1996/1997. An approach involving simultaneously fitting both detector and source parameters was implemented within XSPEC, a standard x-ray spectral fitting package (Arnaud 1996). Theoretical and practical difficulties in fitting spectra taken with flow proportional counters (FPC) and solid state detectors (SSD) are discussed, including both effects incorporated into the numerical model, and those which must be estimated outside the model. Sensitivity of the parameter of interest, the counts in a strong line in the spectrum, to changes and errors in the other fit parameters is explored. The impact of uncertainties on the overall absolute AXAF calibration is discussed.

Paper Details

Date Published: 11 July 1997
PDF: 8 pages
Proc. SPIE 3113, Grazing Incidence and Multilayer X-Ray Optical Systems, (11 July 1997); doi: 10.1117/12.278841
Show Author Affiliations
Richard J. Edgar, Smithsonian Astrophysical Observatory (United States)
Eugene Y. Tsiang, Smithsonian Astrophysical Observatory (United States)
Allyn F. Tennant, NASA Marshall Space Flight Ctr. (United States)
S. A. Vitek, Smithsonian Astrophysical Observatory (United States)
Douglas A. Swartz, Universities' Space Research Association (United States)


Published in SPIE Proceedings Vol. 3113:
Grazing Incidence and Multilayer X-Ray Optical Systems
Richard B. Hoover; Arthur B. C. Walker, Editor(s)

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