Share Email Print

Proceedings Paper

Analysis of Cd1-xZnxTe microstructure
Author(s): Jason R. Heffelfinger; Douglas L. Medlin; H. Yoon; Haim Hermon; Ralph B. James
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The microstructure and chemical inhomogeneities of commercially available Cd1-xZnxTe (CZT) have been evaluated using electron microscopy and microanalytical techniques. Since imperfections, such as inclusions, cracks and extended crystallographic defects are known to affect the performance of CZT gamma-ray spectrometers, understanding the nature and origins of such imperfections is vital to the improvement of device performance. CZT that is grown using a high-pressure Bridgeman method has a polycrystalline microstructure containing numerous grain boundaries, twins and inclusions. In this study, scanning electron microscopy and x- ray energy-dispersive spectroscopy were used to analyze inclusions and cracks inside CZT material. Such analysis found regions of material rich in C, O, Si, Zn, and Te. Transmission electron microscopy revealed small subgrains and thin platelets of a second phase material located inside the large- grain CZT matrix. Details of these microstructural features and their possible origins are discussed.

Paper Details

Date Published: 7 July 1997
PDF: 11 pages
Proc. SPIE 3115, Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications, (7 July 1997); doi: 10.1117/12.277702
Show Author Affiliations
Jason R. Heffelfinger, Sandia National Labs. (United States)
Douglas L. Medlin, Sandia National Labs. (United States)
H. Yoon, Sandia National Labs. (United States)
Haim Hermon, Sandia National Labs. (United States)
Ralph B. James, Sandia National Labs. (United States)

Published in SPIE Proceedings Vol. 3115:
Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications
Richard B. Hoover; F. Patrick Doty, Editor(s)

© SPIE. Terms of Use
Back to Top