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Proceedings Paper

X-ray silicon detectors for measuring hard x-ray radiation damage effects
Author(s): Delia Wagner; Eugenia T. Halmagean; Dido Y. Loukas; K. Misiakos; Elisabeth Tsoi; A. Veron; M. Ohanisian
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Paper Abstract

For high sensitivity hard x-ray detector applications there is a solid-state alternative using high purity silicon as starting material. The paper presents some original results concerning a radiation hardened technology to be used for obtaining x-ray silicon detectors and the behavior of the special designed devices in a specific radiation environment. Original processing sequences were experimentally tested and results concerning the most performant technology suited for this specific application are presented. Specially designed gettering steps were applied by backside ion implantation and annealing for enhancing the minority carriers lifetime in the substrate material and for reducing leakage currents at orders less than 10 nA. After a complete presentation of the specific characteristics of the as obtained detectors, they were exposed and completely characterized in x-ray ambient up to dose levels of 108 rad (E greater than 50 keV). Solutions for increasing the detector sensitivity and stability in radiation environments are proposed.

Paper Details

Date Published: 7 July 1997
PDF: 9 pages
Proc. SPIE 3115, Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications, (7 July 1997); doi: 10.1117/12.277698
Show Author Affiliations
Delia Wagner, Polytechnic Univ. (Romania)
Eugenia T. Halmagean, National Institute of Research for Microtechnology (Romania)
Dido Y. Loukas, National Ctr. for Scientific Research "Demokritos" (Greece)
K. Misiakos, National Ctr. for Scientific Research "Demokritos" (Greece)
Elisabeth Tsoi, National Ctr. for Scientific Research "Demokritos" (Greece)
A. Veron, Baneasa SA (Romania)
M. Ohanisian, Baneasa SA (Romania)


Published in SPIE Proceedings Vol. 3115:
Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications
Richard B. Hoover; F. Patrick Doty, Editor(s)

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