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Proceedings Paper

Orthogonal strip gamma-ray imaging system for use with HgI2 and Cd1-xZnxTe detectors
Author(s): Nathan R. Hilton; James C. Lund; Jack E. McKisson; Bruce Andrew Brunett; John M. Van Scyoc; Ralph B. James; H. Bradford Barber
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Paper Abstract

We have designed and constructed an orthogonal strip imaging system for use with room temperature semiconductor strip detectors. The system has been tested with both HgI2 and Cd1-xZnxTe (CZT) detector elements. Our first system consists of complete readout electronics and software for spectroscopy and imaging with 8 by 8 orthogonal strip detectors. The readout electronics consist of 16 channels of hybrid charge sensitive preamplifiers, and 16 channels of parallel discriminators, shaping amplifiers, and a 16 channel ADC implemented in CAMAC and NIM. The software used to readout the instrument is capable of performing intensity measurements as well as spectroscopy on all 64 pixels of the device. In this paper we describe measurements to determine the factors limiting the performance of this system.

Paper Details

Date Published: 7 July 1997
PDF: 6 pages
Proc. SPIE 3115, Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications, (7 July 1997); doi: 10.1117/12.277686
Show Author Affiliations
Nathan R. Hilton, Univ. of Arizona (United States)
James C. Lund, Sandia National Labs. (United States)
Jack E. McKisson, RTI, Inc. (United States)
Bruce Andrew Brunett, Carnegie Mellon Univ. (United States)
John M. Van Scyoc, Univ. of California/Los Angeles (United States)
Ralph B. James, Sandia National Labs. (United States)
H. Bradford Barber, Univ. of Arizona (United States)

Published in SPIE Proceedings Vol. 3115:
Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications
Richard B. Hoover; F. Patrick Doty, Editor(s)

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