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Proceedings Paper

Nonlinear characterization of semiconductor-doped fiber
Author(s): Eric Donkor; Raymond K. Boncek
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Paper Abstract

We report here an experimental result for the non-linear refractive index of a CdSSe-doped fiber measured at 1313 nm. The semiconductor is in the form of nano-spherical particles randomly scattered in the glass host. The linear properties of the fiber have been reported. The approach for the measurement of the nonlinear refractive index follows the Z-scan method developed by Sheik-Bahae et al. The set-up measures the transmittance of the sample as a function of the position of the sample as it traverses through the foal point of the illuminating 1313 nm laser radiation.

Paper Details

Date Published: 1 July 1997
PDF: 2 pages
Proc. SPIE 3075, Photonic Processing Technology and Applications, (1 July 1997); doi: 10.1117/12.277633
Show Author Affiliations
Eric Donkor, Univ. of Connecticut (United States)
Raymond K. Boncek, Philips Broadband Networks, Inc. (United States)


Published in SPIE Proceedings Vol. 3075:
Photonic Processing Technology and Applications
Andrew R. Pirich; Raymond K. Boncek, Editor(s)

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