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Proceedings Paper

Spectrometer design for transmission and reflection measurements of full-scale windows
Author(s): Donald S. Fisher; Darrel Fuller
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Paper Abstract

Current spectrometers are unsuitable for measuring transmission of large thick electro-optical windows because the optical path through the instrument is changed by the optic. Customization of a standard FTIR spectrometer capable of making normal and non-normal incidence angle transmission and reflection measurements is presented which addresses this and other problems associated with high precision spectroradiometry. Emphasis is on design features to ensure ordinate accuracy of these measurements. These techniques can replace witness sample testing commonly made in the industry.

Paper Details

Date Published: 27 June 1997
PDF: 13 pages
Proc. SPIE 3060, Window and Dome Technologies and Materials V, (27 June 1997); doi: 10.1117/12.277068
Show Author Affiliations
Donald S. Fisher, Exotic Electro-Optics Inc. (United States)
Darrel Fuller, Exotic Electro-Optics Inc. (United States)


Published in SPIE Proceedings Vol. 3060:
Window and Dome Technologies and Materials V
Randal W. Tustison, Editor(s)

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