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Proceedings Paper

Leaky waveguide laser diodes for advanced manufacturing and metrology
Author(s): Jingchang Zhong; Ronghui Li; Yingjie Zhao; Yi Qu
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Paper Abstract

We have successfully designed and prepared gain-guided high power 1 .3- 1 .55i m leaky waveguide (LWG) laser diodes. taking into account their loss mechanisms such as Auger electron non-radiative recombination, carrier leakage over the heterobarrier, and inter-valence-band absorption etc. This is the first time to incorporate the leaky waveguide structure into the quaternary 111-V compounds in order to obtain in long wavelength region high power laser diodes for advanced manufacturing and metrology. In this work we have shown that the incorporation of the leaky waveguide structure into the material system would reduce the threshold current density and alleviate the loss mechanisms. This would result in a reduction in lasing threshold current and an improvement in the temperature sensitivity. It was grown by a unique liquid phase epitaxy (LPE) and was modified by growing an intrinsic InGaASP waveguiding layer which replaced its n-type counterpart as in usual large optical cavity devices and provided a higher temperature stability than that of conventional DH lasers. Using the LWG structure, we have obtained 1 .55 i m laser diodes with threshold currents comparable to common lasers ( th 2.7 KA/cm2) but with the characteristic temperature T0 near to those of GaAs-AlGaAs lasers (140K).Especially, we have attained the peak output powers up to higher than 2W per facet in pulsed operation at room temperature.

Paper Details

Date Published: 17 July 1996
PDF: 6 pages
Proc. SPIE 2860, Laser Interferometry VIII: Techniques and Analysis, (17 July 1996); doi: 10.1117/12.276322
Show Author Affiliations
Jingchang Zhong, Changchun Institute of Optics and Fine Mechanics (China)
Ronghui Li, Changchun Institute of Optics and Fine Mechanics (China)
Yingjie Zhao, Changchun Institute of Optics and Fine Mechanics (China)
Yi Qu, Changchun Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 2860:
Laser Interferometry VIII: Techniques and Analysis
Malgorzata Kujawinska; Ryszard J. Pryputniewicz; Mitsuo Takeda, Editor(s)

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