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Proceedings Paper

Optoelectronic developments in speckle interferometry
Author(s): Ralph P. Tatam
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Paper Abstract

Speckle interferomeiry is now being used extensively in a range of engineering metrology applications. This paper reviews how developments in optoelectronic technology, such as solid state laser sources and optical fibre, have led to advances in the measurement capability of speckle interferometer systems. Examples are presented of surface profile, surface slope, static displacement and displacement gradient, and vibration measurement including heterodyning and stroboscopic techniques.

Paper Details

Date Published: 17 July 1996
PDF: 19 pages
Proc. SPIE 2860, Laser Interferometry VIII: Techniques and Analysis, (17 July 1996); doi: 10.1117/12.276306
Show Author Affiliations
Ralph P. Tatam, Cranfield Univ. (United Kingdom)


Published in SPIE Proceedings Vol. 2860:
Laser Interferometry VIII: Techniques and Analysis
Malgorzata Kujawinska; Ryszard J. Pryputniewicz; Mitsuo Takeda, Editor(s)

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