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Proceedings Paper

Determination of the activation energy of electron traps with fractional glow technique
Author(s): A. Opanowicz; Piotr Pietrucha
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Paper Abstract

The fractional glow technique (FGT) developed by Gobrecht and Hofmann for determination of trap energy distribution in an insulating crystal is examined. The fractional thermoluminescence (TL) curves are generated by numerical solutions of the basic kinetic equations describing an insulator model with two kinds of interactive electron traps. The results show that two different activation energies of traps are resolved with the FGT when the corresponding individual TL peaks are not strongly overlapped.

Paper Details

Date Published: 13 June 1997
PDF: 4 pages
Proc. SPIE 3179, Solid State Crystals in Optoelectronics and Semiconductor Technology, (13 June 1997); doi: 10.1117/12.276244
Show Author Affiliations
A. Opanowicz, Technical Univ. of Lodz (Poland)
Piotr Pietrucha, Technical Univ. of Lodz (Poland)


Published in SPIE Proceedings Vol. 3179:
Solid State Crystals in Optoelectronics and Semiconductor Technology
Antoni Rogalski; Jaroslaw Rutkowski; Andrzej Majchrowski; Jerzy Zielinski, Editor(s)

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