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Proceedings Paper

X-ray determination of the thermal expansion of TiN, TiC and Ti(N,C) crystals
Author(s): Krystyna Wokulska
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Paper Abstract

Precise lattice parameters of stoichiometric TiN, TiC and Ti(N,C) solid solutions whiskers and needle-like crystals have been determined using the Bond's method. Temperature measurement of lattice parameters in the range 290-600 K have been performed and thermal expansion coefficients (alpha) have been determined. A non-linear change of coefficients (alpha) with the composition has been found. The observed decrease of (alpha) values for solid solutions crystals was related to the character of chemical bonds.

Paper Details

Date Published: 13 June 1997
PDF: 4 pages
Proc. SPIE 3179, Solid State Crystals in Optoelectronics and Semiconductor Technology, (13 June 1997); doi: 10.1117/12.276221
Show Author Affiliations
Krystyna Wokulska, Univ. of Silesia (Poland)

Published in SPIE Proceedings Vol. 3179:
Solid State Crystals in Optoelectronics and Semiconductor Technology
Antoni Rogalski; Jaroslaw Rutkowski; Andrzej Majchrowski; Jerzy Zielinski, Editor(s)

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