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Proceedings Paper

SEISM: scene electro-optical image generator and sensor model
Author(s): Olivier Jagueneau; Yves Klein
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Paper Abstract

For several years, Thomson-CSF Optronique has been using an internally developed scene and sensor model in the design of passive optronic systems. SEISM (Scene Electro-optical Image generator, and Sensor Model) is a powerful comprehensive tool that can easily produce physically accurate synthetic images including cluttered backgrounds. The scene is created using the image generation software EXPLORETM which undertakes 3D modeling, scene setting and non real-time rendering with texture mapping. The radiance reaching the sensor is computed by a multi-band (0.3 - 15 micrometers ) optronic scene model connected to a material database, and coupled with the atmospheric propagation code LOWTRAN7. Realistic complex backgrounds are created using either synthetic textures or real imagery (digitized aerial photographs or satellite images) mapped on Digital Terrain Model. These textures are converted into material or radiance textures in the waveband of the sensor. Special effects like concealing by clouds and realistic solar shadows (cloud and target shadows cast on the background) can be included in the scene. The generic sensor model simulates staring arrays, scanned and micro-scanned arrays. It faithfully reproduces the spectral, spatial and temporal effects introduced by a sensor. SEISM has been developed in order to meet the following needs: support to sensor design, visual evaluation of system performance, and algorithms validation as an alternative to field testing. This paper describes both scene and sensor model.

Paper Details

Date Published: 16 June 1997
PDF: 11 pages
Proc. SPIE 3063, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing VIII, (16 June 1997); doi: 10.1117/12.276077
Show Author Affiliations
Olivier Jagueneau, Thomson-CSF (France)
Yves Klein, Thomson-CSF (France)


Published in SPIE Proceedings Vol. 3063:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing VIII
Gerald C. Holst, Editor(s)

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