Share Email Print
cover

Proceedings Paper

Comparison between rigorous light-scattering methods
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In this paper four radically different methods for solving scattering of light off of mainly lameller grating type structures are compared. The methods are: (1) the analytic waveguide method (Metrologia), (2) the integral equation system with parametrization and sampling along the profile (IESMP) developed at BIFO, (3) the integral equation method with discretization along the x-axis (PC-Grate 2), and (4) the rigorous coupled-wave analysis (RCWA). The results show that the analytic waveguide method and the integral equation method with parametrization (IESMP) agree with extremely high accuracy in all cases studied for both polarization states TE and TM. For the special case of near field slit simulation the same high agreement is found between Metrologia and a FEM method. It is also found that the agreement of RCWA and PC-Grate 2 with either of the other two methods is only fair, particularly for TM mode on gratings made of good conductors. Using an improvement, the RCWA results become significantly better and correspond with the results of IESMP and Metrologia.

Paper Details

Date Published: 7 July 1997
PDF: 14 pages
Proc. SPIE 3051, Optical Microlithography X, (7 July 1997); doi: 10.1117/12.276040
Show Author Affiliations
Mark P. Davidson, Spectel Co. (United States)
Bernd H. Kleemann, Institut fuer Angewandte Analysis und Stochastik (Germany)
Joerg Bischoff, Technical Univ. Ilmenau (Germany)


Published in SPIE Proceedings Vol. 3051:
Optical Microlithography X
Gene E. Fuller, Editor(s)

© SPIE. Terms of Use
Back to Top