Share Email Print

Proceedings Paper

3D imaging of VLSI wafer surfaces using a multiple-detector SEM
Author(s): Yaron I. Gold; Radel Ben-Av; Mark Wagner
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Measuring and inspecting the topography of very small features during the fabrication of VLSI devices plays a major role in process control and production yield enhancement. Optical and confocal microscopes lack the resolution needed for today's most advanced processes. Atomic Force Microscopy provides the necessary x, y, and z measurements, but is relatively slow and has limitations due to the necessity of placing a probe with finite size into circuit structures. Scanning electron microscopy (SEM) is today's preferred technology for this task. However, traditional SEM images have a 'flat' vertical appearance, and do not present an accurate representation of the actual surface topography. Tilted SEMs provided a view of wafer topography, but they are slower and are limited to projectile images of the device which do not always show complete structures such as contact holes. A multiple detector SEM enables the development of a method for producing high resolution images of the sample's surface. These images, processed on silicon graphics work stations, produce 3D renditions of the surface from different points of view while maintaining the capability of visualizing complete surface features. In this paper we describe the above method, and provide results, including sample surface profiles and images obtained from actual wafer samples.

Paper Details

Date Published: 7 July 1997
PDF: 7 pages
Proc. SPIE 3050, Metrology, Inspection, and Process Control for Microlithography XI, (7 July 1997); doi: 10.1117/12.275954
Show Author Affiliations
Yaron I. Gold, Opal Technologies Ltd. (Israel)
Radel Ben-Av, Opal Technologies Ltd. (Israel)
Mark Wagner, Opal Technologies Ltd. (Israel)

Published in SPIE Proceedings Vol. 3050:
Metrology, Inspection, and Process Control for Microlithography XI
Susan K. Jones, Editor(s)

© SPIE. Terms of Use
Back to Top