Share Email Print
cover

Proceedings Paper

Acid diffusion control in chemical amplification positive resists by exchange reaction of conjugate bases
Author(s): Toshio Sakamizu; Tadashi Arai; Hidenori Yamaguchi; Hiroshi Shiraishi
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Alkyl-substituted-onium halides (tetraalkylammonium and trialkylsulfonium halides) are investigated for possible application as an acid diffusion controller in a chemical amplification positive resist. The resist sensitivity became lower as their concentration increased because these additives can trap the catalytically active acid to produce a neutral onium salt and a catalytically inactive acid in the resist matrix. The contrast of the resist with tetramethylammonium iodide (TMNI) and trimethylsulfonium iodide (MESI), which can both produce hydrogen iodide was more than two times higher than without an additive, while the resists with other onium halides showed no evidence of contrast enhancement. An experiment on the acid diffusion range showed that the diffusion range of these iodides was much lower than with no additive, and MESI exhibited a smaller diffusion range than TMNI. This indicates that MESI is the most effective diffusion controller. Patterning of resists was carried out with an e- beam lithography system at 50 kV. The resist with MESI exhibited a remarkable resolution enhancement. It can produce high resolution patterns (90-nm contact holes) at a dose of 16.2 (mu) C/cm2.

Paper Details

Date Published: 7 July 1997
PDF: 11 pages
Proc. SPIE 3049, Advances in Resist Technology and Processing XIV, (7 July 1997); doi: 10.1117/12.275845
Show Author Affiliations
Toshio Sakamizu, Hitachi Ltd. (Japan)
Tadashi Arai, Hitachi Ltd. (Japan)
Hidenori Yamaguchi, Hitachi Ltd. (Japan)
Hiroshi Shiraishi, Hitachi Ltd. (Japan)


Published in SPIE Proceedings Vol. 3049:
Advances in Resist Technology and Processing XIV
Regine G. Tarascon-Auriol, Editor(s)

© SPIE. Terms of Use
Back to Top