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Proceedings Paper

Doppler-shifted self-reflected wave from a semiconductor
Author(s): Alex Schuelzgen; S. Hughes; Nasser Peyghambarian
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Paper Abstract

We report the first experimental observation of a self- reflected wave inside a very dense saturable absorber. An intense femtosecond pulse saturates the absorption and causes a density front moving into the semiconductor sample. Due to the motion of the boundary between saturated and unsaturated areas of the sample the light reflected at this boundary is red-shifted by the Doppler effect. The spectrally shifted reflection makes it possible to distinguish between surface reflection and self-reflection and is used to proof the concept of the dynamic nonlinear skin effect experimentally. Quite well agreement with model calculations is found.

Paper Details

Date Published: 6 June 1997
PDF: 7 pages
Proc. SPIE 2994, Physics and Simulation of Optoelectronic Devices V, (6 June 1997); doi: 10.1117/12.275588
Show Author Affiliations
Alex Schuelzgen, Optical Sciences Ctr./Univ. of Arizona (United States)
S. Hughes, Optical Sciences Ctr./Univ. of Arizona (United States)
Nasser Peyghambarian, Optical Sciences Ctr./Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 2994:
Physics and Simulation of Optoelectronic Devices V
Marek Osinski; Weng W. Chow, Editor(s)

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