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Proceedings Paper

Experimental measurement of the variation in sensitivity within a single pixel of a CCD
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Paper Abstract

The sensitivity of a solid state detector array varies as a result of changes in transmission, diffusion effects and scattering. This variation will occur on a scale length less than that of a single pixel and its knowledge is of importance for improved device design and in applications such as event centroiding in photon counting systems. This paper reports on a measurement of sensitivity variation on a sub-pixel scale for a two-phase front-illuminated CCD. The measurement was made using a scanning reflection microscope. Variation in sensitivity between the phases within a pixel and on much smaller spatial scale are clearly observed as well as crosstalk.

Paper Details

Date Published: 25 April 1997
PDF: 8 pages
Proc. SPIE 3019, Solid State Sensor Arrays: Development and Applications, (25 April 1997); doi: 10.1117/12.275189
Show Author Affiliations
Daniel Kavaldjiev, Rochester Institute of Technology (United States)
Zoran Ninkov, Rochester Institute of Technology (United States)


Published in SPIE Proceedings Vol. 3019:
Solid State Sensor Arrays: Development and Applications
Morley M. Blouke, Editor(s)

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