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Proceedings Paper

1-million-pixel progressive-scan 60-fps IT-CCD image sensor
Author(s): Shin'ichi Kawai; Keisuke Hatano; Shinobu Suwazono; Fumihiro Futamura; Daisuke Shohji; Satoshi Katoh; Yasutaka Nakashiba; Michihiro Morimoto; Eiji Takeuchi; Kouichi Arai; Toshihiro Kawamura; Yukio Taniji; Kozo Orihara; Nobukazu Teranishi; Yasuaki Hokari
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Paper Abstract

A 1M-pixel progressive-scan interline-transfer CCD image sensor has been developed.It features high resolution, real- time speed and square pixels. A real-time speed was obtained by a pair of H-CCDs, located at the upper and lower of the image area and driven at 43MHz. Charges of the upper and lower halves of the image area are output separately by using the upper and lower H-CCDs, respectively. This operation enables a 1024 by 1024 progressive scan at 60 frame/sec. The device can be operated in a 512 by 512 progressive scan at 120 frame/sec by combining the charges in each of two vertically-adjacent pixels and two horizontally-adjacent pixels. Furthermore, a 1024 by 1024 interlace scan at 120 field/sec is also acceptable for either frame-integration or field-integration. The device can also be operated in a 1024 by 1024 progressive scan at 30 frame/sec by using only one of the H-CCD.

Paper Details

Date Published: 25 April 1997
PDF: 9 pages
Proc. SPIE 3019, Solid State Sensor Arrays: Development and Applications, (25 April 1997); doi: 10.1117/12.275173
Show Author Affiliations
Shin'ichi Kawai, NEC Corp. (Japan)
Keisuke Hatano, NEC Corp. (Japan)
Shinobu Suwazono, NEC Corp. (Japan)
Fumihiro Futamura, NEC Corp. (Japan)
Daisuke Shohji, NEC Corp. (Japan)
Satoshi Katoh, NEC Corp. (Japan)
Yasutaka Nakashiba, NEC Corp. (Japan)
Michihiro Morimoto, NEC Corp. (Japan)
Eiji Takeuchi, NEC Corp. (Japan)
Kouichi Arai, NEC Corp. (Japan)
Toshihiro Kawamura, NEC Corp. (Japan)
Yukio Taniji, NEC Corp. (Japan)
Kozo Orihara, NEC Corp. (Japan)
Nobukazu Teranishi, NEC Corp. (Japan)
Yasuaki Hokari, NEC Corp. (Japan)


Published in SPIE Proceedings Vol. 3019:
Solid State Sensor Arrays: Development and Applications
Morley M. Blouke, Editor(s)

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