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Proceedings Paper

Simple high-precision extinction method for measuring refractive index of transparent materials
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Paper Abstract

Linearly polarized light remains linearly polarized after reflection from a transparent material at oblique incidence. The reflected polarization angle is determined from the extinction position of the analyzer. If the incident polarization angle is 45 deg, the reflected polarization angle gives the ratio of the reflected p-wave to s-wave. This value can be used to determine the index of refraction from Fresnel equations. With our instrument, the uncertainty in the deduced refractive index is +/- 0.0004. This method is fast, convenient, and versatile enough to provide accurate results on small laboratory samples. In addition to measuring the refractive index, the method is sufficiently accurate to characterize the homogeneity of transparent materials.

Paper Details

Date Published: 1 June 1991
PDF: 7 pages
Proc. SPIE 1441, Laser-Induced Damage in Optical Materials: 1990, (1 June 1991); doi: 10.1117/12.27512
Show Author Affiliations
Soe-Mie F. Nee, Naval Weapons Ctr. (United States)
Harold E. Bennett, Naval Weapons Ctr. (United States)


Published in SPIE Proceedings Vol. 1441:
Laser-Induced Damage in Optical Materials: 1990
Harold E. Bennett; Lloyd L. Chase; Arthur H. Guenther; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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