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Proceedings Paper

Beam diagnostics challenges for future FELs
Author(s): Alex H. Lumpkin
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Paper Abstract

Designs are being developed to produce diffraction-limited sources based on storage-ring free-electron lasers (FELs) for the VUV and soft x-ray regime and linac-driven FELs in the few angstrom regime. The requirements on the beam quality in transverse emittance (rms, normalized) of 1 - 2 pi mm mrad, bunch length (1 ps to 100 fs), and peak current (1 to 5 kA) result in new demands on the diagnostics. The diagnostics challenges include spatial resolution (1 - 10 micrometer), temporal resolution (less than 100 fs), and single-pulse position measurements (approximately 1 micrometer). Examples of recent submicropulse (slice) work are cited as well as concepts based on spontaneous emission radiation (SER). The nonintercepting aspects of some of these diagnostics should also be applicable to high-power FELs.

Paper Details

Date Published: 15 May 1997
PDF: 8 pages
Proc. SPIE 2988, Free-Electron Laser Challenges, (15 May 1997); doi: 10.1117/12.274369
Show Author Affiliations
Alex H. Lumpkin, Argonne National Lab. (United States)


Published in SPIE Proceedings Vol. 2988:
Free-Electron Laser Challenges
Patrick G. O'Shea; Harold E. Bennett, Editor(s)

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