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Proceedings Paper

Characterization of optical coatings: damage threshold/local absorption correlation
Author(s): Anne Fornier; C. Cordillot; D. Bernardino; Odile Lam; Andre Roussel; Claude Amra; Ludovic Escoubas; Gerard Albrand; Mireille Commandre
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Paper Abstract

Simultaneous absorption and scattering mappings are used to study the influence of local defects on the laser damage threshold of thin films. The same area is mapped for absorption an d scatter before and after irradiation at the threshold fluence. The study is performed for an uncoated fused silica substrate and two single-layer films deposited on fused silica substrates at a wavelength of (lambda) equals 1.06 micrometers . Initial results seem to indicate that the irradiation can create and enhance absorption and scattering defects.

Paper Details

Date Published: 13 May 1997
PDF: 14 pages
Proc. SPIE 2966, Laser-Induced Damage in Optical Materials: 1996, (13 May 1997); doi: 10.1117/12.274239
Show Author Affiliations
Anne Fornier, CEA/Limeil-Valenton (France)
C. Cordillot, CEA/Limeil-Valenton (France)
D. Bernardino, CEA/Limeil-Valenton (France)
Odile Lam, CEA/Limeil-Valenton (France)
Andre Roussel, CEA/Limeil-Valenton (France)
Claude Amra, LOSCM (France)
Ludovic Escoubas, LOSCM (France)
Gerard Albrand, LOSCM (France)
Mireille Commandre, LOSCM (France)

Published in SPIE Proceedings Vol. 2966:
Laser-Induced Damage in Optical Materials: 1996
Harold E. Bennett; Arthur H. Guenther; Mark R. Kozlowski; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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