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Proceedings Paper

Comparison of the damage frequency method and the binary search technique
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Paper Abstract

This paper presents a direct comparison of the two major laser damage threshold measurement techniques, namely the binary search technique and the damage frequency method. The estimates of the laser damage threshold produced by each technique are compared using three different probability functions. A simple damage defect ensemble model for the damage probability is used as a control. The other probability distributions represent non-ideal cases and have tails in the region near threshold. It is shown that in the latter cases that both test procedures have difficulty in accurately and precisely reporting the threshold. The paper concludes that neither technique as presently formulated is sufficiently accurate or precise enough for applications requiring high confidence in the threshold measurement.

Paper Details

Date Published: 13 May 1997
PDF: 5 pages
Proc. SPIE 2966, Laser-Induced Damage in Optical Materials: 1996, (13 May 1997); doi: 10.1117/12.274222
Show Author Affiliations
Jonathan W. Arenberg, TRW Space and Electronics Group (United States)


Published in SPIE Proceedings Vol. 2966:
Laser-Induced Damage in Optical Materials: 1996
Harold E. Bennett; Arthur H. Guenther; Mark R. Kozlowski; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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