Share Email Print
cover

Proceedings Paper

Characterization of an amorphous-silicon fluoroscopic imager
Author(s): Richard E. Colbeth; Maxwell J. Allen; Derek J. Day; David L. Gilblom; Martin E. Klausmeier-Brown; John M. Pavkovich; Edward J. Seppi; Edward G. Shapiro
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

This paper describes a dual-mode, flat panel imaging system capable of both fluoroscopy and radiography. Two generations of large area sensing technology are described. The general system architecture incorporates both the high sensitivity and data throughput required for fluoroscopy with the large signal capacity, spatial resolution and form factor necessary for radiography.

Paper Details

Date Published: 2 May 1997
PDF: 10 pages
Proc. SPIE 3032, Medical Imaging 1997: Physics of Medical Imaging, (2 May 1997); doi: 10.1117/12.274010
Show Author Affiliations
Richard E. Colbeth, Varian Associates, Inc. (United States)
Maxwell J. Allen, Varian Associates, Inc. (United States)
Derek J. Day, Varian Associates, Inc. (United States)
David L. Gilblom, Varian Associates, Inc. (United States)
Martin E. Klausmeier-Brown, Varian Associates, Inc. (United States)
John M. Pavkovich, Varian Associates, Inc. (United States)
Edward J. Seppi, Varian Associates, Inc. (United States)
Edward G. Shapiro, Varian Associates, Inc. (United States)


Published in SPIE Proceedings Vol. 3032:
Medical Imaging 1997: Physics of Medical Imaging
Richard L. Van Metter; Jacob Beutel, Editor(s)

© SPIE. Terms of Use
Back to Top