Share Email Print

Proceedings Paper

Fast bistable nematic display using surface defects
Author(s): Riccardo Barberi; M. Giocondo; J. Li; R. Bartolino; Ivan N. Dozov; Georges E. Durand
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We present a novel fast bistable nematic cell with intrinsic grey scale. The geometry of a single pixel is the usual sandwich one, with tow conductive flat plates that contain a film of nematic material with positive dielectric anisotropy. An electric field is applied perpendicularly to the boundary plates. This novel deice works by controlling the creation and the erasure of surface defects on a suitable surface when the applied electric field is strong enough to achieve the anchoring breaking condition: (xi) equals L, where (xi) is the coherence length of the electric field and L is the anchoring extrapolation length. Note that these surface defects should disappear onto a usual monostable substrate, due to topological constraints. Particular surface conditions are required to stabilize them. The surface defects depolarize the incident light and, as their density can be modulated, a grey scale can be achieved. Up to now, the maximum measured optical contrast is 200:1. The typical writing and erasing voltages are in the order of 50 Volts for a pulse length of 50 microsecond(s) ec on a sample of 5 micrometers thickness.

Paper Details

Date Published: 8 May 1997
PDF: 8 pages
Proc. SPIE 3013, Projection Displays III, (8 May 1997); doi: 10.1117/12.273876
Show Author Affiliations
Riccardo Barberi, INFM/Univ. della Calabria (Italy)
M. Giocondo, INFM/Univ. della Calabria (Italy)
J. Li, INFM/Univ. della Calabria (Italy)
R. Bartolino, INFM/Univ. della Calabria (Italy)
Ivan N. Dozov, Univ. de Paris-Sud (France)
Georges E. Durand, Univ. de Paris-Sud (France)

Published in SPIE Proceedings Vol. 3013:
Projection Displays III
Ming Hsien Wu, Editor(s)

© SPIE. Terms of Use
Back to Top