Share Email Print
cover

Proceedings Paper

Laser-assisted surface modification of thin chromium films
Author(s): David A. Willis; Xianfan Xu; Chie C. Poon; Andrew C. Tam
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The objective of this work is to develop a novel process by which topographical changes are produced on a micrometer scale using a pulsed Nd:YLF laser, and to investigate the energy transfer and fluid flow phenomena involved in the process. The surface of thin chromium films is altered through the laser- induced phase transformation and fluid flow. Experimental parametric studies were conducted to correlate the laser parameters with the topography of the laser irradiated surfaces. Experimental and analytical work were also performed to study the transport phenomena involved in the process. A numerical finite element analysis was carried out to simulate the transient field variables. A nanosecond-time resolution, fast photography system was constructed to capture the phase change and the fluid flow occurring at the target surface. Comparison between the numerical and the experimental data helps to understand the mechanisms of the process as well as to develop a controlled surface modification technique.

Paper Details

Date Published: 9 May 1997
PDF: 10 pages
Proc. SPIE 2991, Laser Applications in Microelectronic and Optoelectronic Manufacturing II, (9 May 1997); doi: 10.1117/12.273738
Show Author Affiliations
David A. Willis, Purdue Univ. (United States)
Xianfan Xu, Purdue Univ. (United States)
Chie C. Poon, IBM Almaden Research Ctr. (United States)
Andrew C. Tam, IBM Almaden Research Ctr. (United States)


Published in SPIE Proceedings Vol. 2991:
Laser Applications in Microelectronic and Optoelectronic Manufacturing II
Jan J. Dubowski, Editor(s)

© SPIE. Terms of Use
Back to Top