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Proceedings Paper

Characterization of x-ray streak cameras for use on Nova
Author(s): Daniel H. Kalantar; Perry M. Bell; Robert L. Costa; Bruce A. Hammel; Otto L. Landen; Thaddeus J. Orzechowski; Jonathan D. Hares; Anthony K. L. Dymoke-Bradshaw
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Paper Abstract

There are many different types of measurements that require a continuous time history of x-ray emission that can be provided with an x-ray streak camera. In order to properly analyze the images that are recorded with the x-ray streak cameras operated on Nova, it is important to account for the streak characterization of each camera. We have performed a number of calibrations of the streak camera both on the bench as well as with Nova disk target shots where we use a time modulated laser intensity profile (self-beating of the laser) on the target to generate an x-ray comb. We have measured the streak camera sweep direction and spatial offset, curvature of the electron optics, sweep rate, and magnification and resolution of the electron optics.

Paper Details

Date Published: 28 May 1997
PDF: 6 pages
Proc. SPIE 2869, 22nd International Congress on High-Speed Photography and Photonics, (28 May 1997); doi: 10.1117/12.273470
Show Author Affiliations
Daniel H. Kalantar, Lawrence Livermore National Lab. (United States)
Perry M. Bell, Lawrence Livermore National Lab. (United States)
Robert L. Costa, Lawrence Livermore National Lab. (United States)
Bruce A. Hammel, Lawrence Livermore National Lab. (United States)
Otto L. Landen, Lawrence Livermore National Lab. (United States)
Thaddeus J. Orzechowski, Lawrence Livermore National Lab. (United States)
Jonathan D. Hares, Kentech Instruments Ltd. (United Kingdom)
Anthony K. L. Dymoke-Bradshaw, Kentech Instruments Ltd. (United Kingdom)


Published in SPIE Proceedings Vol. 2869:
22nd International Congress on High-Speed Photography and Photonics
Dennis L. Paisley; ALan M. Frank, Editor(s)

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