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Proceedings Paper

Real-time pulse-width monitor for ICCD electro-optic shutters
Author(s): George J. Yates
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Paper Abstract

A method is described for controlling and measuring the pulse width of electrical gate pulses used for optical shuttering of image intensifiers. The intensifiers are coupled to high frame rate Charge-Coupled-Devices (CCD) or Focus-Projection Scan vidicon TV cameras for readout and telemetry of time resolved image sequences. The shutter duration or gate width of individual shutters is measured in real time and encoded in the video frame corresponding to a given shutter interval. The shutter information is updated once each video frame by strobing new data with each TV camera vertical sync pulse. This circuitry is used in conjunction with commercial video insertion/annotation equipment to provide the shutter width information in alpha numeric text form along with the time resolved video image on a frame-by-frame basis. The measurement technique and circuitry involving a combination of high speed digital counters and analog integrators for measurements in the 1 ns to 1024 ns range are described. The accuracy obtained is compared with measurements obtained using high speed DSOs. The measured data are provided in 10-bit Binary (Bi) and four decades of Binary Coded Decimal and also displayed on four digit seven segment displays. The control circuitry including digital and analog input means for gate width selection are described. The implementation of both measurement and control circuitry into an Intensified Shuttered CCD radiometric system for recording fast shuttered images at RS-170 to 4 KHz frame rates is presented.

Paper Details

Date Published: 28 May 1997
PDF: 14 pages
Proc. SPIE 2869, 22nd International Congress on High-Speed Photography and Photonics, (28 May 1997); doi: 10.1117/12.273426
Show Author Affiliations
George J. Yates, Los Alamos National Lab. (United States)


Published in SPIE Proceedings Vol. 2869:
22nd International Congress on High-Speed Photography and Photonics
Dennis L. Paisley; ALan M. Frank, Editor(s)

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