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Proceedings Paper

Further observations of shear localization at the tip of a notch
Author(s): James J. Mason; Keith M. Roessig
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Paper Abstract

An experimental investigation of shear localization at the tip of a notch is reported. The initiation and propagation of shear localization in two aging conditions of 300 maraging steel is recorded using ultra-high-speed photography with the goal of discovering more about; (1) the shear fatigue susceptibility of the materials, and (2) the transition from shear failure to tensile failure. These two areas are identified as important because shear localization as a failure mechanism requires, first, that the material be susceptible to such a localization, second, that the localization be dominant over other modes of failure and, last--due to boundary conditions in specific problems--that the shear localization propagate from one point into another. In reference to the first topic, the fundamental issue is whether shear localization susceptibility can be measured at all. In this work shear localization susceptibility is qualitatively investigated indicating that peak-aged 300 maraging steel is more susceptible than under- aged. The final failure within the shear band is characterized through ultra-high-speed observation and post- mortem examination. Propagation is observed and characterized by impacting side notched plates while observations are made using high speed photography at framing rates of 480,000 fps. Shear failure is seen to propagate at 1000 m/s in peak-aged material and 200 m/s in under-aged material. The peak aged material fails fully by shear while the shear failure in under-aged material arrests and is followed by tensile failure. Finite element modeling is used to determine the nature of elastic wave propagation in the specimen.

Paper Details

Date Published: 28 May 1997
PDF: 8 pages
Proc. SPIE 2869, 22nd International Congress on High-Speed Photography and Photonics, (28 May 1997); doi: 10.1117/12.273368
Show Author Affiliations
James J. Mason, Univ. of Notre Dame (United States)
Keith M. Roessig, Univ. of Notre Dame (United States)


Published in SPIE Proceedings Vol. 2869:
22nd International Congress on High-Speed Photography and Photonics
Dennis L. Paisley; ALan M. Frank, Editor(s)

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