Share Email Print
cover

Proceedings Paper

Shock-wave measurements of solids using the long-pulsed laser
Author(s): Mazakazu Uchino; Masahide Kaetsu; Tsutomu Mashimo
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The optical measurement system using long-pulsed lasers were constructed for shock-wave measurements and spectroscopy under shock compression of solids. We have produced two types of long-pulsed lasers with no Q-switch for such purposes: Nd:YAG frequency-double laser using an intracavity KTP crystal, and dye laser using a rhodamine 6G. They consisted of doubled-elliptical pump cavity, two zenon flash lamps, and a high-voltage electrical-pulse source. The former one can be used as a light source for a Fabry-Perot type Interferometer (FPI), and the latter one can be used as a constant light source for a luminescence or an absorption spectroscopy and for the inclined-mirror method. The inclined-mirror Hugoniot measurements of some materials were performed by using the long-pulsed dye laser and the mirror- rotating type streak camera. The time resolution was increased by using a narrow width slit and the laser. The velocity-interferometer system for shock-wave measurements using a FPI and the time-resolved optical spectroscopy system using a spectrometer were constructed combined with the Nd:YAG frequency-doubled laser and the dye laser, respectively, and with an image-converter streak camera.

Paper Details

Date Published: 28 May 1997
PDF: 5 pages
Proc. SPIE 2869, 22nd International Congress on High-Speed Photography and Photonics, (28 May 1997); doi: 10.1117/12.273357
Show Author Affiliations
Mazakazu Uchino, Kumamoto Univ. (Japan)
Masahide Kaetsu, Kumamoto Univ. (Japan)
Tsutomu Mashimo, Kumamoto Univ. (Japan)


Published in SPIE Proceedings Vol. 2869:
22nd International Congress on High-Speed Photography and Photonics
Dennis L. Paisley; ALan M. Frank, Editor(s)

© SPIE. Terms of Use
Back to Top