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Proceedings Paper

Ellipsometric studies of photochromic ultrathin polymer films
Author(s): Harald Knobloch; S. Katholy; Horst Orendi; J. Hesse; Dietrich Prescher; Ludwig Brehmer; Ralf Ruhmann
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Paper Abstract

We present ellipsometric measurements on Langmuir-Blodgett monolayer assemblies of photochromic polymers; the polymer we used was a statistical copolymer with polymethacrylate mainchains and azobenzene sidegroups. Ellipsometry gives a value of n equals 1.557 for the refractive index and a film thickness of 1.58 nm per monolayer. When exposed to light of appropriate wavelength, the azobenzene groups undergo a trans (reversible reaction) cis photoisomerization process which was monitored by ellipsometry. We found an average change in film thickness of 0.02 nm per monolayer during the trans(reversible reaction)cis transition process, whereas the data obtained do not show any significant change in refractive index.

Paper Details

Date Published: 1 April 1997
PDF: 5 pages
Proc. SPIE 3094, Polarimetry and Ellipsometry, (1 April 1997); doi: 10.1117/12.271826
Show Author Affiliations
Harald Knobloch, Univ. Potsdam (Germany)
S. Katholy, Univ. Potsdam (Germany)
Horst Orendi, Univ. Potsdam (Germany)
J. Hesse, Univ. Potsdam (Germany)
Dietrich Prescher, Univ. Potsdam (Germany)
Ludwig Brehmer, Univ. Potsdam (Germany)
Ralf Ruhmann, Institut fuer Angewandte Chemie eV (Germany)

Published in SPIE Proceedings Vol. 3094:
Polarimetry and Ellipsometry
Maksymilian Pluta; Tomasz R. Wolinski, Editor(s)

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