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Proceedings Paper

Polarimetry of semiconductor exciton spectra
Author(s): Z. B. Nitsovich; C. Yu. Zenkova; Bohdan M. Nitsovich
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Paper Abstract

In this paper one of the methods of polarimeter investigation of exciton spectra is proposed. The analysis is based on the peculiarities of semiconductor layer crystals, the dipole moment of the exciton transition and one of the main properties of the laser wave, its polarization. As a result, libation oscillations of the exciton dipole become quite actual in anisotropic semiconductors. This leads to the change of the mechanism of light absorption on the exciton frequencies and to the actualization of the indirect vertical phototransition with the change of the polarization angle. These processes result in the depolarization of the absorption spectrum, its structurization, and redistribution of the power along the frequency scale. Finally, the dying away of purely exciton absorption and the increase of oscillatory components take place.

Paper Details

Date Published: 1 April 1997
PDF: 4 pages
Proc. SPIE 3094, Polarimetry and Ellipsometry, (1 April 1997); doi: 10.1117/12.271814
Show Author Affiliations
Z. B. Nitsovich, Chernivtsy State Univ. (Ukraine)
C. Yu. Zenkova, Chernivtsy State Univ. (Ukraine)
Bohdan M. Nitsovich, Chernivtsy State Univ. (Ukraine)

Published in SPIE Proceedings Vol. 3094:
Polarimetry and Ellipsometry
Maksymilian Pluta; Tomasz R. Wolinski, Editor(s)

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