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Proceedings Paper

Null-polarimetric studies of waveplate parameters
Author(s): Oleg S. Kushnir; Orest G. Vlokh
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Paper Abstract

A polarimetric technique for studying the parameters of the waveplates is developed. It uses dependencies of the polarization azimuth and ellipticity of the light emergent from the waveplate on the azimuth of linearly polarized incident light. When the latter azimuth is sufficiently small, the dependencies become linear, their slopes being dependent on the phase retardation of the crystal plate. This allows to test the waveplates with a high accuracy. Relevant results obtained for a number of quartz and mica quarter-wave retarders are presented. The technique is compared with the other methods known in the literature.

Paper Details

Date Published: 1 April 1997
PDF: 7 pages
Proc. SPIE 3094, Polarimetry and Ellipsometry, (1 April 1997); doi: 10.1117/12.271807
Show Author Affiliations
Oleg S. Kushnir, Lviv State Univ. (Ukraine)
Orest G. Vlokh, Institute of Physical Optics (Ukraine)

Published in SPIE Proceedings Vol. 3094:
Polarimetry and Ellipsometry
Maksymilian Pluta; Tomasz R. Wolinski, Editor(s)

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