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Proceedings Paper

High-resolution Mueller matrix polarimetry of thin film PLZT electro-optic modulators
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Paper Abstract

A thin-film lead-lanthanum-zirconate-titanate (PLZT) electro-optic spatial light modulator has been characterized with the Mueller matrix imaging polarimeter (MMIP). The MMIP is a dual rotating-retarder polarimeter which illuminates a sample with calibrated polarized states and analyzes the existing polarized state over a spatially-resolved image of the sample images of the retardance magnitude and retardance fast axis orientation reveal the relative electric field strengths in the PLZT 9/65/35 material. By measuring Mueller matrix images of the device at several different applied voltages, a quadratic electro-optic coefficient of 2 X 10-16 (m/V)2 was determined in the modulator active regions.

Paper Details

Date Published: 11 April 1997
PDF: 6 pages
Proc. SPIE 3008, Miniaturized Systems with Micro-Optics and Micromechanics II, (11 April 1997); doi: 10.1117/12.271437
Show Author Affiliations
Elizabeth A. Sornsin, Univ. of Alabama in Huntsville (United States)
Russell A. Chipman, Univ. of Alabama in Huntsville (United States)


Published in SPIE Proceedings Vol. 3008:
Miniaturized Systems with Micro-Optics and Micromechanics II
M. Edward Motamedi; Larry J. Hornbeck; Kristofer S. J. Pister, Editor(s)

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