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Proceedings Paper

Real-time holographic nondestructive inspection system with automatic defect classification
Author(s): Helen H. Chen; Tin M. Aye; Dai Hyun Kim; Jack A. Latchinian; Vernon A. Brown; Andrew A. Kostrzewski; Gajendra D. Savant; Tomasz P. Jannson; Charles G. Pergantis
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Paper Abstract

We describe here a holographic non-destructive inspection (NDI) technology developed by Physical Optics Corporation. It is based on real-time holographic dye polymer materials and a shearographic camera, with neural network defect classification software. Holograms can be recorded in or erased from the new dye polymer material in a millisecond without wet processing, making real-time holographic NDI feasible. The shearographic NDI system, based on laser speckle interferometry, compensates for low-light conditions. Both holographic and shearographic fringes are input to the neural network system to perform automatic defect type classification.

Paper Details

Date Published: 15 April 1997
PDF: 8 pages
Proc. SPIE 3029, Machine Vision Applications in Industrial Inspection V, (15 April 1997); doi: 10.1117/12.271244
Show Author Affiliations
Helen H. Chen, Physical Optics Corp. (United States)
Tin M. Aye, Physical Optics Corp. (United States)
Dai Hyun Kim, Physical Optics Corp. (United States)
Jack A. Latchinian, Physical Optics Corp. (United States)
Vernon A. Brown, Physical Optics Corp. (United States)
Andrew A. Kostrzewski, Physical Optics Corp. (United States)
Gajendra D. Savant, Physical Optics Corp. (United States)
Tomasz P. Jannson, Physical Optics Corp. (United States)
Charles G. Pergantis, Army Research Lab. (United States)


Published in SPIE Proceedings Vol. 3029:
Machine Vision Applications in Industrial Inspection V
A. Ravishankar Rao; Ning S. Chang, Editor(s)

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