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Proceedings Paper

Diffusion equation and its application to SMD inspection
Author(s): Bingcheng Li; Jesus Rene Villalobos; Jose Mario Gallegos; Sergio D. Cabrera
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Paper Abstract

The diffusion equation has received increasing attention in the fields of image analysis and computer vision for tasks such as image smoothing, image enhancement, feature extraction as well as dominant point detection. In this paper, the diffusion equation is applied to the inspection of surface mounted devices. It is shown experimentally that diffusion-equation-based methods could render very good discriminating features. The inspection experiments show that the correct inspection rate of the diffusion-equation- based method is very high for both training boards and test boards.

Paper Details

Date Published: 15 April 1997
PDF: 10 pages
Proc. SPIE 3029, Machine Vision Applications in Industrial Inspection V, (15 April 1997); doi: 10.1117/12.271238
Show Author Affiliations
Bingcheng Li, Univ. of Texas/El Paso (United States)
Jesus Rene Villalobos, Univ. of Texas/El Paso (United States)
Jose Mario Gallegos, Univ. of Texas/El Paso (United States)
Sergio D. Cabrera, Univ. of Texas/El Paso (United States)


Published in SPIE Proceedings Vol. 3029:
Machine Vision Applications in Industrial Inspection V
A. Ravishankar Rao; Ning S. Chang, Editor(s)

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