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Proceedings Paper

Bent-fiber near-field scanning optical microscopy probes for use with commercial atomic force microscopes
Author(s): Roderick S. Taylor; Kurt E. Leopold; Mark A. Wendman; Gus Gurley; Virgil B. Elings
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Paper Abstract

The adaptation of a Digital Instruments DimensionTM 3000 atomic-force microscope to provide a near-field scanning optical microscopy capability is described. The enabling technology for the adaptation is the bent optical fiber probe. The design and operation of this probe to measure evanescent fields emerging from optical waveguides is described.

Paper Details

Date Published: 15 April 1997
PDF: 11 pages
Proc. SPIE 3009, Micromachining and Imaging, (15 April 1997); doi: 10.1117/12.271220
Show Author Affiliations
Roderick S. Taylor, National Research Council of Canada (Canada)
Kurt E. Leopold, National Research Council of Canada (Canada)
Mark A. Wendman, Digital Instruments, Inc. (United States)
Gus Gurley, Digital Instruments, Inc. (United States)
Virgil B. Elings, Digital Instruments, Inc. (United States)


Published in SPIE Proceedings Vol. 3009:
Micromachining and Imaging
Terry A. Michalske; Mark A. Wendman, Editor(s)

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