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Proceedings Paper

Optoelectronic backplane interconnect technology development (POINT)
Author(s): Yung-Sheng Liu; W. B. Hennessy; R. J. Wojnarowski; Julian P. G. Bristow; Yue Liu; John R. Rowlette Sr.; Jared D. Stack; James T. Yardley; Louay A. Eldada; Richard M. Osgood Jr.; Robert Scarmozzino; Shin H. Lee; Susant K. Patra
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Paper Abstract

This paper describes the technical approach and progresses of the POINT program. This project is a collaborative effort among GE, Honeywell, AMP, AlliedSignal, Columbia University and University of California at San Diego, sponsored by DARPA/ETO to develop affordable optoelectronic packaging and interconnect technologies for board and backplane applications. In this paper, we report the development of a backplane interconnect structure using polymer waveguides to an interconnect length of 280 mm to demonstrate high density and high speed interconnect, and the related technical development efforts on: (a) a high density and high speed VCSEL array packaging technology that employs planar fabrication and batch processing for low-cost manufacturing, (b) passive alignment techniques for reducing recurrent cost in optoelectronic assembly, (c) low-cost optical polymers for board and backplane level interconnects, and (d) CAD tools for modeling multimode guided wave systems and assisting optoelectronic packaging mechanical design.

Paper Details

Date Published: 4 April 1997
PDF: 9 pages
Proc. SPIE 3005, Optoelectronic Interconnects and Packaging IV, (4 April 1997); doi: 10.1117/12.271090
Show Author Affiliations
Yung-Sheng Liu, GE Corporate Research and Development Ctr. (United States)
W. B. Hennessy, GE Corporate Research and Development Ctr. (United States)
R. J. Wojnarowski, GE Corporate Research and Development Ctr. (United States)
Julian P. G. Bristow, Honeywell Technology Ctr. (United States)
Yue Liu, Honeywell Technology Ctr. (United States)
John R. Rowlette Sr., AMP, Inc. (United States)
Jared D. Stack, AMP, Inc. (United States)
James T. Yardley, AlliedSignal Inc. (United States)
Louay A. Eldada, AlliedSignal Inc. (United States)
Richard M. Osgood Jr., Columbia Univ. (United States)
Robert Scarmozzino, Columbia Univ. (United States)
Shin H. Lee, Univ. of California/San Diego (United States)
Susant K. Patra, Univ. of California/San Diego (United States)

Published in SPIE Proceedings Vol. 3005:
Optoelectronic Interconnects and Packaging IV
Ray T. Chen; Peter S. Guilfoyle, Editor(s)

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